TY  - JOUR 
AU  - Gomes, Hugo
AU  - Rodríguez Testera, Alejandro
AU  - Carvalho, Nuno Borges
AU  - Fernández Barciela, Mónica
AU  - Remley, Kate A
PY  - 2011
SN  - 00189480
SN  - 15579670
UR  - http://hdl.handle.net/11093/3522
AB  - In this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We...
LA  - eng
PB  - IEEE Transactions on Microwave Theory and Techniques
TI  - Diode power probe measurements of wireless signals
DO  - 10.1109/TMTT.2010.2100405
ER  -