TY  - GEN 
AU  - Gomes, Hugo
AU  - Rodríguez Testera, Alejandro
AU  - Carvalho, Nuno Borges
AU  - Fernández Barciela, Mónica
AU  - Remley, Kate A
PY  - 2010
SN  - 9781424460564
UR  - http://hdl.handle.net/11093/3486
AB  - This paper presents an analysis of long term-memory effects on power measurements with diode power probes. We show that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals....
LA  - eng
TI  - The impact of long-term memory effects on diode power probes
DO  - 10.1109/MWSYM.2010.5514791
ER  -