RT Journal Article
T1 Long term experimental verification of a single chip quantum random number generator fabricated on the InP platform
A1 Chrysostomidis, Themistoklis
A1 Roumpos, Ioannis
A1 Álvarez Outerelo, David
A1 Troncoso Costas, Marcos
A1 Moskalenko, Valentina
A1 Garcia Escartin, Juan Carlos
A1 Díaz Otero, Francisco Javier
A1 Vyrsokinos, Konstantinos
K1 3307 Tecnología Electrónica
AB This work presents the results from the experimental evaluation of a quantum random number generator circuit over a period of 300 minutes based on a single chip fabricated on the InP platform. The circuit layout contains a gain switched laser diode (LD), followed by a balanced Mach Zehnder Interferometer for proper light power distribution to the two arms of an unbalanced MZI incorporating a 65.4 mm long spiral waveguide that translates the random phase fluctuations to power variations. The LD was gain-switched at 1.3 GHz and the chip delivered a min-entropy of 0.5875 per bit after removal of the classical noise, resulting a total aggregate bit rate of 6.11 Gbps. The recoded data set successfully passed the 15-battery test NIST statistical test suite for all data sets.
PB EPJ Quantum Technology
SN 21960763
YR 2023
FD 2023-02-10
LK http://hdl.handle.net/11093/4558
UL http://hdl.handle.net/11093/4558
LA eng
NO EPJ Quantum Technology, 10(5): 1-15 (2023)
NO Agencia Estatal de Investigación | Ref. PID2020-119418GB-I00
DS Investigo
RD 18-abr-2025