dc.contributor.author | Outumuro González, Ismael | |
dc.contributor.author | Diz Bugarin, Javier | |
dc.contributor.author | Valencia Alvarez, José Luis | |
dc.contributor.author | Blanco García, Jesús | |
dc.contributor.author | Vázquez Dorrío, José Benito | |
dc.contributor.editor | Society of Photo-Optical Instrumentation Engineers (SPIE) | spa |
dc.date.accessioned | 2024-02-12T08:45:56Z | |
dc.date.issued | 2017-08-22 | |
dc.identifier.isbn | 9781510613836 | |
dc.identifier.isbn | 9781510613843 | |
dc.identifier.uri | http://hdl.handle.net/11093/6207 | |
dc.description.abstract | This paper shows the progress made in the wavemeter developed to give traceability to the wavelength of lasers and ECDLs (External Cavity Laser Diode). The improvements are: duplication of the optical path of the laser beams due to a double pass through the interferometer arms, the electronic fringe counter, the measurement of the refractive index of air and the uncertainty calculations of the wavelength for the case of lasers with frequencies that differs more than 10 THz from laser reference. The new measurements improve the previous results. | spa |
dc.language.iso | eng | spa |
dc.rights | Atribución 4.0 Internacional | |
dc.rights | © 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/deed.es | |
dc.title | Wavemeter improvements for laser diode calibration | eng |
dc.type | conferenceObject | spa |
dc.rights.accessRights | openAccess | spa |
dc.identifier.doi | 10.1117/12.2272010 | |
dc.identifier.editor | https://doi.org/10.1117/12.2272010 | spa |
dc.publisher.departamento | Física aplicada | spa |
dc.conferenceObject.type | Comunicación extensa internacional | spa |
dc.identifier.conferenceObject | Third International Conference on Applications of Optics and Photonics, Faro, Portugal, Portugal, 8-12 mayo 2017 | spa |
dc.publisher.grupoinvestigacion | GRUPO DE ENXEÑARÍA FÍSICA (OF1) | spa |
dc.subject.unesco | 2209.10 láseres | spa |
dc.subject.unesco | 2203.01 Circuitos | spa |
dc.subject.unesco | 2214.02 Metrología | spa |
dc.date.updated | 2024-02-09T16:25:09Z | |
dc.computerCitation | pub_title=Wavemeter improvements for laser diode calibration|volume=undefined|journal_number=|start_pag=248|end_pag=255|congress_title=Third International Conference on Applications of Optics and Photonics|start_date=8/5/2017|end_date=12/5/2017 | spa |